50 lines
1.3 KiB
C
50 lines
1.3 KiB
C
/*
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* Test-related constants for sandbox
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*
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* Copyright (c) 2014 Google, Inc
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*
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* SPDX-License-Identifier: GPL-2.0+
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*/
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#ifndef __ASM_TEST_H
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#define __ASM_TEST_H
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/* The sandbox driver always permits an I2C device with this address */
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#define SANDBOX_I2C_TEST_ADDR 0x59
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#define SANDBOX_PCI_VENDOR_ID 0x1234
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#define SANDBOX_PCI_DEVICE_ID 0x5678
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#define SANDBOX_PCI_CLASS_CODE PCI_CLASS_CODE_COMM
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#define SANDBOX_PCI_CLASS_SUB_CODE PCI_CLASS_SUB_CODE_COMM_SERIAL
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/**
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* sandbox_i2c_set_test_mode() - set test mode for running unit tests
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*
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* See sandbox_i2c_xfer() for the behaviour changes.
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*
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* @bus: sandbox I2C bus to adjust
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* @test_mode: true to select test mode, false to run normally
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*/
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void sandbox_i2c_set_test_mode(struct udevice *bus, bool test_mode);
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enum sandbox_i2c_eeprom_test_mode {
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SIE_TEST_MODE_NONE,
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/* Permits read/write of only one byte per I2C transaction */
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SIE_TEST_MODE_SINGLE_BYTE,
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};
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void sandbox_i2c_eeprom_set_test_mode(struct udevice *dev,
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enum sandbox_i2c_eeprom_test_mode mode);
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void sandbox_i2c_eeprom_set_offset_len(struct udevice *dev, int offset_len);
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/*
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* sandbox_timer_add_offset()
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*
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* Allow tests to add to the time reported through lib/time.c functions
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* offset: number of milliseconds to advance the system time
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*/
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void sandbox_timer_add_offset(unsigned long offset);
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#endif
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