173 lines
5.4 KiB
C
173 lines
5.4 KiB
C
/* SPDX-License-Identifier: GPL-2.0+ */
|
|
/*
|
|
* Copyright (c) 2013 Google, Inc.
|
|
*/
|
|
|
|
#ifndef __TEST_TEST_H
|
|
#define __TEST_TEST_H
|
|
|
|
#include <malloc.h>
|
|
#include <linux/bitops.h>
|
|
|
|
/*
|
|
* struct unit_test_state - Entire state of test system
|
|
*
|
|
* @fail_count: Number of tests that failed
|
|
* @skip_count: Number of tests that were skipped
|
|
* @start: Store the starting mallinfo when doing leak test
|
|
* @of_live: true to use livetree if available, false to use flattree
|
|
* @of_root: Record of the livetree root node (used for setting up tests)
|
|
* @root: Root device
|
|
* @testdev: Test device
|
|
* @force_fail_alloc: Force all memory allocs to fail
|
|
* @skip_post_probe: Skip uclass post-probe processing
|
|
* @fdt_chksum: crc8 of the device tree contents
|
|
* @fdt_copy: Copy of the device tree
|
|
* @fdt_size: Size of the device-tree copy
|
|
* @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
|
|
* @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
|
|
* @of_other: Live tree for the other FDT
|
|
* @runs_per_test: Number of times to run each test (typically 1)
|
|
* @force_run: true to run tests marked with the UT_TESTF_MANUAL flag
|
|
* @expect_str: Temporary string used to hold expected string value
|
|
* @actual_str: Temporary string used to hold actual string value
|
|
*/
|
|
struct unit_test_state {
|
|
int fail_count;
|
|
int skip_count;
|
|
struct mallinfo start;
|
|
struct device_node *of_root;
|
|
bool of_live;
|
|
struct udevice *root;
|
|
struct udevice *testdev;
|
|
int force_fail_alloc;
|
|
int skip_post_probe;
|
|
uint fdt_chksum;
|
|
void *fdt_copy;
|
|
uint fdt_size;
|
|
void *other_fdt;
|
|
int other_fdt_size;
|
|
struct device_node *of_other;
|
|
int runs_per_test;
|
|
bool force_run;
|
|
char expect_str[512];
|
|
char actual_str[512];
|
|
};
|
|
|
|
/* Test flags for each test */
|
|
enum {
|
|
UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
|
|
UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
|
|
UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
|
|
UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
|
|
UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
|
|
UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
|
|
/* do extra driver model init and uninit */
|
|
UT_TESTF_DM = BIT(6),
|
|
UT_TESTF_OTHER_FDT = BIT(7), /* read in other device tree */
|
|
/*
|
|
* Only run if explicitly requested with 'ut -f <suite> <test>'. The
|
|
* test name must end in "_norun" so that pytest detects this also,
|
|
* since it cannot access the flags.
|
|
*/
|
|
UT_TESTF_MANUAL = BIT(8),
|
|
};
|
|
|
|
/**
|
|
* struct unit_test - Information about a unit test
|
|
*
|
|
* @name: Name of test
|
|
* @func: Function to call to perform test
|
|
* @flags: Flags indicated pre-conditions for test
|
|
*/
|
|
struct unit_test {
|
|
const char *file;
|
|
const char *name;
|
|
int (*func)(struct unit_test_state *state);
|
|
int flags;
|
|
};
|
|
|
|
/**
|
|
* UNIT_TEST() - create linker generated list entry for unit a unit test
|
|
*
|
|
* The macro UNIT_TEST() is used to create a linker generated list entry. These
|
|
* list entries are enumerate tests that can be execute using the ut command.
|
|
* The list entries are used both by the implementation of the ut command as
|
|
* well as in a related Python test.
|
|
*
|
|
* For Python testing the subtests are collected in Python function
|
|
* generate_ut_subtest() by applying a regular expression to the lines of file
|
|
* u-boot.sym. The list entries have to follow strict naming conventions to be
|
|
* matched by the expression.
|
|
*
|
|
* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
|
|
* foo that can be executed via command 'ut foo bar' and is implemented in
|
|
* function foo_test_bar().
|
|
*
|
|
* @_name: concatenation of name of the test suite, "_test_", and the name
|
|
* of the test
|
|
* @_flags: an integer field that can be evaluated by the test suite
|
|
* implementation
|
|
* @_suite: name of the test suite concatenated with "_test"
|
|
*/
|
|
#define UNIT_TEST(_name, _flags, _suite) \
|
|
ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
|
|
.file = __FILE__, \
|
|
.name = #_name, \
|
|
.flags = _flags, \
|
|
.func = _name, \
|
|
}
|
|
|
|
/* Get the start of a list of unit tests for a particular suite */
|
|
#define UNIT_TEST_SUITE_START(_suite) \
|
|
ll_entry_start(struct unit_test, ut_ ## _suite)
|
|
#define UNIT_TEST_SUITE_COUNT(_suite) \
|
|
ll_entry_count(struct unit_test, ut_ ## _suite)
|
|
|
|
/* Use ! and ~ so that all tests will be sorted between these two values */
|
|
#define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
|
|
#define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
|
|
#define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
|
|
|
|
/* Sizes for devres tests */
|
|
enum {
|
|
TEST_DEVRES_SIZE = 100,
|
|
TEST_DEVRES_COUNT = 10,
|
|
TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
|
|
|
|
/* A few different sizes */
|
|
TEST_DEVRES_SIZE2 = 15,
|
|
TEST_DEVRES_SIZE3 = 37,
|
|
};
|
|
|
|
/**
|
|
* testbus_get_clear_removed() - Test function to obtain removed device
|
|
*
|
|
* This is used in testbus to find out which device was removed. Calling this
|
|
* function returns a pointer to the device and then clears it back to NULL, so
|
|
* that a future test can check it.
|
|
*/
|
|
struct udevice *testbus_get_clear_removed(void);
|
|
|
|
#ifdef CONFIG_SANDBOX
|
|
#include <asm/state.h>
|
|
#include <asm/test.h>
|
|
#endif
|
|
|
|
static inline void arch_reset_for_test(void)
|
|
{
|
|
#ifdef CONFIG_SANDBOX
|
|
state_reset_for_test(state_get_current());
|
|
#endif
|
|
}
|
|
static inline int test_load_other_fdt(struct unit_test_state *uts)
|
|
{
|
|
int ret = 0;
|
|
#ifdef CONFIG_SANDBOX
|
|
ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
|
|
#endif
|
|
return ret;
|
|
}
|
|
|
|
#endif /* __TEST_TEST_H */
|