67 lines
		
	
	
		
			1.8 KiB
		
	
	
	
		
			C
		
	
	
	
			
		
		
	
	
			67 lines
		
	
	
		
			1.8 KiB
		
	
	
	
		
			C
		
	
	
	
| // SPDX-License-Identifier: GPL-2.0
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| /*
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|  * Copyright (c) 2018, STMicroelectronics
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|  */
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| 
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| #include <common.h>
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| #include <serial.h>
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| #include <dm.h>
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| #include <dm/test.h>
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| #include <test/ut.h>
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| 
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| static int dm_test_serial(struct unit_test_state *uts)
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| {
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| 	struct serial_device_info info_serial = {0};
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| 	struct udevice *dev_serial;
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| 	uint value_serial;
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| 
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial",
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| 					      &dev_serial));
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| 
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| 	ut_assertok(serial_tstc());
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| 	/*
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| 	 * test with default config which is the only one supported by
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| 	 * sandbox_serial driver
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| 	 */
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| 	ut_assertok(serial_setconfig(SERIAL_DEFAULT_CONFIG));
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| 	ut_assertok(serial_getconfig(&value_serial));
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| 	ut_assert(value_serial == SERIAL_DEFAULT_CONFIG);
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| 	ut_assertok(serial_getinfo(&info_serial));
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| 	ut_assert(info_serial.type == SERIAL_CHIP_UNKNOWN);
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| 	ut_assert(info_serial.addr == SERIAL_DEFAULT_ADDRESS);
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| 	/*
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| 	 * test with a parameter which is NULL pointer
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| 	 */
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| 	ut_asserteq(-EINVAL, serial_getconfig(NULL));
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| 	ut_asserteq(-EINVAL, serial_getinfo(NULL));
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| 	/*
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| 	 * test with a serial config which is not supported by
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| 	 * sandbox_serial driver: test with wrong parity
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| 	 */
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| 	ut_asserteq(-ENOTSUPP,
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| 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_ODD,
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| 						   SERIAL_8_BITS,
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| 						   SERIAL_ONE_STOP)));
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| 	/*
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| 	 * test with a serial config which is not supported by
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| 	 * sandbox_serial driver: test with wrong bits number
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| 	 */
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| 	ut_asserteq(-ENOTSUPP,
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| 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
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| 						   SERIAL_6_BITS,
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| 						   SERIAL_ONE_STOP)));
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| 
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| 	/*
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| 	 * test with a serial config which is not supported by
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| 	 * sandbox_serial driver: test with wrong stop bits number
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| 	 */
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| 	ut_asserteq(-ENOTSUPP,
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| 		    serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
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| 						   SERIAL_8_BITS,
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| 						   SERIAL_TWO_STOP)));
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| 
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| 	return 0;
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| }
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| 
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| DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT);
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