162 lines
5.4 KiB
C
162 lines
5.4 KiB
C
/*
|
|
* linux/include/linux/mtd/bbm.h
|
|
*
|
|
* NAND family Bad Block Management (BBM) header file
|
|
* - Bad Block Table (BBT) implementation
|
|
*
|
|
* Copyright (c) 2005-2007 Samsung Electronics
|
|
* Kyungmin Park <kyungmin.park@samsung.com>
|
|
*
|
|
* Copyright (c) 2000-2005
|
|
* Thomas Gleixner <tglx@linuxtronix.de>
|
|
*
|
|
* SPDX-License-Identifier: GPL-2.0+
|
|
*/
|
|
#ifndef __LINUX_MTD_BBM_H
|
|
#define __LINUX_MTD_BBM_H
|
|
|
|
/* The maximum number of NAND chips in an array */
|
|
#ifndef CONFIG_SYS_NAND_MAX_CHIPS
|
|
#define CONFIG_SYS_NAND_MAX_CHIPS 1
|
|
#endif
|
|
|
|
/**
|
|
* struct nand_bbt_descr - bad block table descriptor
|
|
* @param options options for this descriptor
|
|
* @param pages the page(s) where we find the bbt, used with
|
|
* option BBT_ABSPAGE when bbt is searched,
|
|
* then we store the found bbts pages here.
|
|
* Its an array and supports up to 8 chips now
|
|
* @param offs offset of the pattern in the oob area of the page
|
|
* @param veroffs offset of the bbt version counter in the oob are of the page
|
|
* @param version version read from the bbt page during scan
|
|
* @param len length of the pattern, if 0 no pattern check is performed
|
|
* @param maxblocks maximum number of blocks to search for a bbt. This number of
|
|
* blocks is reserved at the end of the device
|
|
* where the tables are written.
|
|
* @param reserved_block_code if non-0, this pattern denotes a reserved
|
|
* (rather than bad) block in the stored bbt
|
|
* @param pattern pattern to identify bad block table or factory marked
|
|
* good / bad blocks, can be NULL, if len = 0
|
|
*
|
|
* Descriptor for the bad block table marker and the descriptor for the
|
|
* pattern which identifies good and bad blocks. The assumption is made
|
|
* that the pattern and the version count are always located in the oob area
|
|
* of the first block.
|
|
*/
|
|
struct nand_bbt_descr {
|
|
int options;
|
|
int pages[CONFIG_SYS_NAND_MAX_CHIPS];
|
|
int offs;
|
|
int veroffs;
|
|
uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
|
|
int len;
|
|
int maxblocks;
|
|
int reserved_block_code;
|
|
uint8_t *pattern;
|
|
};
|
|
|
|
/* Options for the bad block table descriptors */
|
|
|
|
/* The number of bits used per block in the bbt on the device */
|
|
#define NAND_BBT_NRBITS_MSK 0x0000000F
|
|
#define NAND_BBT_1BIT 0x00000001
|
|
#define NAND_BBT_2BIT 0x00000002
|
|
#define NAND_BBT_4BIT 0x00000004
|
|
#define NAND_BBT_8BIT 0x00000008
|
|
/* The bad block table is in the last good block of the device */
|
|
#define NAND_BBT_LASTBLOCK 0x00000010
|
|
/* The bbt is at the given page, else we must scan for the bbt */
|
|
#define NAND_BBT_ABSPAGE 0x00000020
|
|
/* bbt is stored per chip on multichip devices */
|
|
#define NAND_BBT_PERCHIP 0x00000080
|
|
/* bbt has a version counter at offset veroffs */
|
|
#define NAND_BBT_VERSION 0x00000100
|
|
/* Create a bbt if none exists */
|
|
#define NAND_BBT_CREATE 0x00000200
|
|
/*
|
|
* Create an empty BBT with no vendor information. Vendor's information may be
|
|
* unavailable, for example, if the NAND controller has a different data and OOB
|
|
* layout or if this information is already purged. Must be used in conjunction
|
|
* with NAND_BBT_CREATE.
|
|
*/
|
|
#define NAND_BBT_CREATE_EMPTY 0x00000400
|
|
/* Search good / bad pattern through all pages of a block */
|
|
#define NAND_BBT_SCANALLPAGES 0x00000800
|
|
/* Scan block empty during good / bad block scan */
|
|
#define NAND_BBT_SCANEMPTY 0x00001000
|
|
/* Write bbt if neccecary */
|
|
#define NAND_BBT_WRITE 0x00002000
|
|
/* Read and write back block contents when writing bbt */
|
|
#define NAND_BBT_SAVECONTENT 0x00004000
|
|
/* Search good / bad pattern on the first and the second page */
|
|
#define NAND_BBT_SCAN2NDPAGE 0x00008000
|
|
/* Search good / bad pattern on the last page of the eraseblock */
|
|
#define NAND_BBT_SCANLASTPAGE 0x00010000
|
|
/*
|
|
* Use a flash based bad block table. By default, OOB identifier is saved in
|
|
* OOB area. This option is passed to the default bad block table function.
|
|
*/
|
|
#define NAND_BBT_USE_FLASH 0x00020000
|
|
/*
|
|
* Do not store flash based bad block table marker in the OOB area; store it
|
|
* in-band.
|
|
*/
|
|
#define NAND_BBT_NO_OOB 0x00040000
|
|
/*
|
|
* Do not write new bad block markers to OOB; useful, e.g., when ECC covers
|
|
* entire spare area. Must be used with NAND_BBT_USE_FLASH.
|
|
*/
|
|
#define NAND_BBT_NO_OOB_BBM 0x00080000
|
|
|
|
/*
|
|
* Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr
|
|
* was allocated dynamicaly and must be freed in nand_release(). Has no meaning
|
|
* in nand_chip.bbt_options.
|
|
*/
|
|
#define NAND_BBT_DYNAMICSTRUCT 0x80000000
|
|
|
|
/* The maximum number of blocks to scan for a bbt */
|
|
#define NAND_BBT_SCAN_MAXBLOCKS 4
|
|
|
|
/*
|
|
* Constants for oob configuration
|
|
*/
|
|
#define ONENAND_BADBLOCK_POS 0
|
|
|
|
/*
|
|
* Bad block scanning errors
|
|
*/
|
|
#define ONENAND_BBT_READ_ERROR 1
|
|
#define ONENAND_BBT_READ_ECC_ERROR 2
|
|
#define ONENAND_BBT_READ_FATAL_ERROR 4
|
|
|
|
/**
|
|
* struct bbt_info - [GENERIC] Bad Block Table data structure
|
|
* @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
|
|
* @param badblockpos [INTERN] position of the bad block marker in the oob area
|
|
* @param bbt [INTERN] bad block table pointer
|
|
* @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
|
|
* @param priv [OPTIONAL] pointer to private bbm date
|
|
*/
|
|
struct bbm_info {
|
|
int bbt_erase_shift;
|
|
int badblockpos;
|
|
int options;
|
|
|
|
uint8_t *bbt;
|
|
|
|
int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt);
|
|
|
|
/* TODO Add more NAND specific fileds */
|
|
struct nand_bbt_descr *badblock_pattern;
|
|
|
|
void *priv;
|
|
};
|
|
|
|
/* OneNAND BBT interface */
|
|
extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
|
|
extern int onenand_default_bbt (struct mtd_info *mtd);
|
|
|
|
#endif /* __LINUX_MTD_BBM_H */
|