137 lines
		
	
	
		
			4.2 KiB
		
	
	
	
		
			C
		
	
	
	
			
		
		
	
	
			137 lines
		
	
	
		
			4.2 KiB
		
	
	
	
		
			C
		
	
	
	
/* SPDX-License-Identifier: GPL-2.0+ */
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/*
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 * Copyright (c) 2013 Google, Inc.
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 */
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#ifndef __TEST_TEST_H
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#define __TEST_TEST_H
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#include <malloc.h>
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#include <linux/bitops.h>
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/*
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 * struct unit_test_state - Entire state of test system
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 *
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 * @fail_count: Number of tests that failed
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 * @start: Store the starting mallinfo when doing leak test
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 * @of_live: true to use livetree if available, false to use flattree
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 * @of_root: Record of the livetree root node (used for setting up tests)
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 * @root: Root device
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 * @testdev: Test device
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 * @force_fail_alloc: Force all memory allocs to fail
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 * @skip_post_probe: Skip uclass post-probe processing
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 * @expect_str: Temporary string used to hold expected string value
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 * @actual_str: Temporary string used to hold actual string value
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 */
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struct unit_test_state {
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	int fail_count;
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	struct mallinfo start;
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	struct device_node *of_root;
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	bool of_live;
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	struct udevice *root;
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	struct udevice *testdev;
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	int force_fail_alloc;
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	int skip_post_probe;
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	char expect_str[256];
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	char actual_str[256];
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};
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/* Test flags for each test */
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enum {
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	UT_TESTF_SCAN_PDATA	= BIT(0),	/* test needs platform data */
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	UT_TESTF_PROBE_TEST	= BIT(1),	/* probe test uclass */
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	UT_TESTF_SCAN_FDT	= BIT(2),	/* scan device tree */
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	UT_TESTF_FLAT_TREE	= BIT(3),	/* test needs flat DT */
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	UT_TESTF_LIVE_TREE	= BIT(4),	/* needs live device tree */
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	UT_TESTF_CONSOLE_REC	= BIT(5),	/* needs console recording */
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	/* do extra driver model init and uninit */
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	UT_TESTF_DM		= BIT(6),
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};
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/**
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 * struct unit_test - Information about a unit test
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 *
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 * @name: Name of test
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 * @func: Function to call to perform test
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 * @flags: Flags indicated pre-conditions for test
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 */
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struct unit_test {
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	const char *file;
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	const char *name;
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	int (*func)(struct unit_test_state *state);
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	int flags;
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};
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/**
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 * UNIT_TEST() - create linker generated list entry for unit a unit test
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 *
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 * The macro UNIT_TEST() is used to create a linker generated list entry. These
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 * list entries are enumerate tests that can be execute using the ut command.
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 * The list entries are used both by the implementation of the ut command as
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 * well as in a related Python test.
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 *
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 * For Python testing the subtests are collected in Python function
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 * generate_ut_subtest() by applying a regular expression to the lines of file
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 * u-boot.sym. The list entries have to follow strict naming conventions to be
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 * matched by the expression.
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 *
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 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
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 * foo that can be executed via command 'ut foo bar' and is implemented in
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 * function foo_test_bar().
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 *
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 * @_name:	concatenation of name of the test suite, "_test_", and the name
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 *		of the test
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 * @_flags:	an integer field that can be evaluated by the test suite
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 *		implementation
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 * @_suite:	name of the test suite concatenated with "_test"
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 */
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#define UNIT_TEST(_name, _flags, _suite)				\
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	ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = {	\
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		.file = __FILE__,					\
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		.name = #_name,						\
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		.flags = _flags,					\
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		.func = _name,						\
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	}
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/* Get the start of a list of unit tests for a particular suite */
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#define UNIT_TEST_SUITE_START(_suite) \
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	ll_entry_start(struct unit_test, ut_ ## _suite)
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#define UNIT_TEST_SUITE_COUNT(_suite) \
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	ll_entry_count(struct unit_test, ut_ ## _suite)
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/* Use ! and ~ so that all tests will be sorted between these two values */
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#define UNIT_TEST_ALL_START()	ll_entry_start(struct unit_test, ut_!)
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#define UNIT_TEST_ALL_END()	ll_entry_start(struct unit_test, ut_~)
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#define UNIT_TEST_ALL_COUNT()	(UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
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/* Sizes for devres tests */
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enum {
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	TEST_DEVRES_SIZE	= 100,
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	TEST_DEVRES_COUNT	= 10,
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	TEST_DEVRES_TOTAL	= TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
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	/* A few different sizes */
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	TEST_DEVRES_SIZE2	= 15,
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	TEST_DEVRES_SIZE3	= 37,
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};
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/**
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 * testbus_get_clear_removed() - Test function to obtain removed device
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 *
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 * This is used in testbus to find out which device was removed. Calling this
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 * function returns a pointer to the device and then clears it back to NULL, so
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 * that a future test can check it.
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 */
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struct udevice *testbus_get_clear_removed(void);
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static inline void arch_reset_for_test(void)
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{
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#ifdef CONFIG_SANDBOX
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#include <asm/state.h>
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	state_reset_for_test(state_get_current());
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#endif
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}
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#endif /* __TEST_TEST_H */
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